All CAEN Experiments
A simple and robust method to study after-pulses in Silicon Photomultipliers
The after-pulsing probability in Silicon Photomultipliers and its time constant are obtained measuring the mean number of photo-electrons in a variable time window following a light pulse. The method, experimentally simple and statistically robust due to the use of the Central Limit Theorem, has been applied to an HAMAMATSU MPPC S10362-11-100C.